Conference & Events
Event Details
Characterisation of sub-micron and nano sized materials
In 1883 Lord Kelvin stated "To measure is to know." When characterising sub-micron particles it is not possible to use a simple optical microscope to validate instrumental characterisation techniques. So the method of analysis of sub-micron particles should be robust and the operator needs an alternative approach to the optical microscope to validate whatever result is obtained. This technical meeting will have presentations on the different techniques available for sub-micron and nano sized characterisation, and will discuss method validation and checking. The important aspects of sample preparation and dispersion, will also be covered.
Date: 17 March 2010 09:00 - 16:45
Event Subject(s):
Analytical
Education
General
Industry & Technology
Venue
Royal Pharmaceutical Society
Lambeth High Street
London
SE1 7JN
United Kingdom
Find this location using Google Map
RSC Organiser Information
Particle Characterisation Group
Sponsored by: Particle Characterisation Group
Contact for Event Information
Name : Mr Ron Buxton
Address:
c/o Particle Technology Ltd
Station Yard Ind Estate
Hatton
DE65 5DU
United Kingdom
Tel:
01283 810091
Fax:
01283 520412
Email:
particle@rsc.org
Additional Information
Booking form or other file(s):
PCIG JPAG Training Meeting March 2010 Registration Form.doc
Additional categories:
Training for Industrialists
Access: Public Event
Ticket/Registration Information:
£145 non members, £125 members, £55 students
