STN AnaVist, Version 2.0, is now the only platform that permits analysis and visualization of both CAplus^SM and Derwent World Patents Index^® (DWPI^SM), with content processed by STN for optimal visualization.  

In addition, with Version 2.0 you can:

• Examine the Research Landscape from your point-of-view - take advantage of new clustering fields, including Technology Indicators, Exemplary/First Claim, All Claims, and International Patent Classification (IPC) Codes, and customize your visualization using combinations of text fields 
• Gain a more complete understanding of your data - create a variety of new bar charts based on Derwent Class, Derwent Manual Codes, Labels, and Patent Country Codes/Kind Codes    
• Perform comparative analysis with ease- use new document highlighting features, and up to eight highlighting colors at once, to compare multiple data sets 
• Enhance your document management - create new custom labels and apply them at any time to individual documents or document sets 
• Pinpoint the research of your competitors and customers- enhance your view of the Research Landscape with new 2D displays with white or black backgrounds 

To start using the new features:

1. Create a document set for visualization with the precise searching capabilities of STN Express^®, Version 8.2. 
2. Import your document set into STN AnaVist, Version 2.0, and click Visualize. 

If you have an STN login ID and password, download STN AnaVist and STN Express software for free, or request the software on CD-ROM. If you are currently using STN Express, Version 8.2, install the discover.fil update when prompted to use all of the new features in STN AnaVist, Version 2.0.

With STN AnaVist, Version 2.0, you can now examine scientific and patent data from all angles.  For additional information, visit the Products & Services web pages by following the link below.