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Communication
Article citation: Simon J. L. Billinge, CrystEngComm, 2010, DOI: 10.1039/b915453a
Characterisation of amorphous and nanocrystalline molecular materials by total scattering
Simon J. L. Billinge, Timur Dykhne, Pavol Juhás, Emil Bo
in, Ryan Taylor, Alastair J. Florence and Kenneth Shankland
The use of high-energy X-ray total scattering coupled with pair distribution function analysis produces unique structural fingerprints from amorphous and nanostructured phases of the pharmaceuticals carbamazepine and indomethacin. The advantages of such facility-based experiments over laboratory-based ones are discussed and the technique is illustrated with the characterisation of a melt-quenched sample of carbamazepine as a nanocrystalline (4.5 nm domain diameter) version of form III.

