RSC Publishing


Publishing

 

Cover image for JAAS, select for current issue

JAAS

Innovative research on the fundamental theory and application of spectrometric techniques.



Subscribers

Non-subscribers

Free access



Paper

J. Anal. At. Spectrom., 2009, 24, 194 - 198, DOI: 10.1039/b810316j

Technique for sensitive carbon depth profiling in thin samples using C–C elastic scattering

Iva Bogdanovi Radovi, Milko Jaki and Francois Schiettekatte

A technique for carbon depth profiling in thin samples is described. It is developed to analyze low concentrations of carbon in heavier matrices. The method is based on the carbon–carbon elastic scattering coincidence measurement. Recoiled carbon atoms as well as scattered carbon ions from the primary beam are detected by two solid state detectors placed symmetrically at 45° around the beam direction. Since scattering products are detected in the forward direction, the method can be applied only for transmission samples with thicknesses of the order of several micrometers. Capabilities of the technique concerning depth resolution and sensitivity were tested on samples with known composition and depth distribution of carbon.

Graphical abstract image for this article (ID: b810316j)