RSC Nanoscience & Nanotechnology
Nanocharacterisation
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DOI: 10.1039/9781847557926
John Hutchison (Editor), Angus Kirkland (Editor)
ISBN (online): 978-1-84755-792-6
ISBN (print): 978-0-85404-241-8
Copyright: 2007
Table of Contents
| Title | Page | |
 Front matter
DOI: 10.1039/9781847557926-FP001 (55Kb) |
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Preface
DOI: 10.1039/9781847557926-FP005 (45Kb) |
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Contents
DOI: 10.1039/9781847557926-FP009 (55Kb) |
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Chapter 1. Characterisation of Nanomaterials Using Transmission Electron Microscopy
DOI: 10.1039/9781847557926-00001 (1Mb) |
1 | Full Access |
| Chapter 2. Scanning Transmission Electron Microscopy | 28 | License Access |
| Chapter 3. Scanning Tunneling Microscopy of Surfaces and Nanostructures | 66 | License Access |
| Chapter 4. Electron Energy-loss Spectroscopy and Energy Dispersive X-Ray Analysis | 94 | License Access |
| Chapter 5. Electron Holography of Nanostructured Materials | 138 | License Access |
| Chapter 6. Electron Tomography | 184 | License Access |
| Chapter 7. In-situ Environmental Transmission Electron Microscopy | 268 | License Access |
| Subject index | License Access |
