Issue 1, 2009
From the journal:

Journal of Analytical Atomic Spectrometry

A high-throughput method for Saccharomyces cerevisiae (yeast) ionomics†

John M. C. Danku,a   Luke Gumaelius,b   Ivan Baxterb  and  David E. Salt*ab  

* Corresponding authors

a Center for Plant Environmental Stress Physiology, 1165 Horticulture Building, Purdue University, West Lafayette, USA
E-mail: dsalt@purdue.edu

b Bindley Bioscience Center, Discovery Park, Purdue University, West Lafayette, USA

Abstract

Reliable and rapid analytical methods are the backbone for generating data and deciphering gene functions in the post-genomics era. We describe here a high-throughput method for the rapid profiling of fourteen elements in the 5153 strain gene deletion collection of Saccharomyces cerevisiae. Samples were grown and processed in standard 96-well plate format followed by inductively coupled plasma mass spectrometry (ICP-MS) analysis. Optical densities of the yeast were measured prior to ICP-MS analysis and used for the normalization of the data. The elemental profiling data are stored in an online database for later bioinformatics analysis. This method has the capacity to run 288 yeast samples per day on a single ICP-MS, and has allowed the quantification of the ionome in four replicate cultures of approximately 240 yeast deletion strains per week, along with appropriate wild-type and positive control strains. We identified 400 strains that were outliers from the overall deletion collection in at least one element out of the fourteen that were monitored.

Graphical abstract: A high-throughput method for Saccharomyces cerevisiae (yeast) ionomics

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Article information

DOI
https://doi.org/10.1039/B803529F
Article type
Technical Note
Submitted
29 Feb 2008
Accepted
22 Aug 2008
First published
21 Oct 2008

J. Anal. At. Spectrom., 2009,24, 103-107

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A high-throughput method for Saccharomyces cerevisiae (yeast) ionomics

J. M. C. Danku, L. Gumaelius, I. Baxter and D. E. Salt, J. Anal. At. Spectrom., 2009, 24, 103 DOI: 10.1039/B803529F

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