Subscribers
Non-subscribers
- Purchase article PDF [£30 + taxes]
- Purchase article PDF member offer [£5 + taxes]
Free access
Review
Annu. Rep. Prog. Chem., Sect. C: Phys. Chem., 2008, 104, 235 - 255, DOI: 10.1039/b703982b
SNIM: Scanning near-field infrared microscopy
Erik Bründermann and Martina Havenith
Scanning near-field infrared microscopy is a powerful label-free technique for chemical imaging with nanometre resolution. It is on the verge of wide-spread applications due to the development of tuneable, easy access high power infrared light sources. Spatial resolution of 10–100 nm is nowadays routinely obtained. Current research activities are shifting from pure instrument development towards applications in the field of material science and biology. This includes detection of the Mott-transition in nano-domains, mapping of the doping concentration in semiconductors, surface characterization with a sensitivity of a single monolayer, and infrared spectroscopy of a single virus.
