Volume 104, 2008
From the journal:

Annual Reports Section "C" (Physical Chemistry)

SNIM: Scanning near-field infrared microscopy

Erik Bründermann*a  and  Martina Havenith*b  

* Corresponding authors

a Ruhr-University Bochum, Physical Chemistry II, NC 7/68, Bochum, Germany
E-mail: erik.bruendermann@rub.de
Fax: 49 234 3214183
Tel: 49 234 3224239

b Ruhr-University Bochum, Physical Chemistry II, NC 7/72, Bochum, Germany
E-mail: martina.havenith@rub.de
Fax: 49 234 3214183
Tel: 49 234 3228249

Abstract

Scanning near-field infrared microscopy is a powerful label-free technique for chemical imaging with nanometre resolution. It is on the verge of wide-spread applications due to the development of tuneable, easy access high power infrared light sources. Spatial resolution of 10–100 nm is nowadays routinely obtained. Current research activities are shifting from pure instrument development towards applications in the field of material science and biology. This includes detection of the Mott-transition in nano-domains, mapping of the doping concentration in semiconductors, surface characterization with a sensitivity of a single monolayer, and infrared spectroscopy of a single virus.

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Article information

DOI
https://doi.org/10.1039/B703982B
Article type
Review Article
First published
01 Apr 2008

Annu. Rep. Prog. Chem., Sect. C: Phys. Chem., 2008,104, 235-255

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SNIM: Scanning near-field infrared microscopy

E. Bründermann and M. Havenith, Annu. Rep. Prog. Chem., Sect. C: Phys. Chem., 2008, 104, 235 DOI: 10.1039/B703982B

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