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Caption : figure s2 h/e index as a function of the hydrogen-to-carbon ratio in a-c:h thin films.

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Caption : figure s3 h3/e2index as a function of the hydrogen-to-carbon ratio in a-c:h thin films.

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Caption : figure s4 sequence of feg-sem images of two different unidirectional sliding measurements. at the top, one sliding trail was performed by using a normal applied force of 500 mn (high value) where plastic deformation as sink-in took place. at the bottom, five sliding trails were performed by using a normal applied force of 10 mn (the same for friction measurements) where no plastic deformation mechanisms are apparent.

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Caption : figure s5 comparison of 2d-top view/3d-topography from untreated substrate (a + b) and substrate deposited (c + d) at h/c ratio = 10 (10% c2h2:90% h2).

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Caption : figure s6 comparison of rms surface roughness of the a-c:h thin films obtained at different h2/c2h2 mixtures.

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Caption : figure s7 comparison of area-scale profiles of fractal dimension (df) between the topography and electrostatic potentials maps.

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Caption : figure s8 (a-d) some steps of lateral force wedge calibration procedure. (a) 3d-topography of standard sample - precision grid plate and (b-c) lateral signal loop (and topography) as function of distance from a scan line under normal deflection signal of 2v (i.e., normal force of 43.2 nn); (d) normal force estimative by f-d curve of standard sample. the calibration factor of 1800 nn/v is determined through the half-width friction loop w(l) and the offset friction loop ∆(l) as function of normal force used. 

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Caption : figure s9 (a-e) 2d-topography afm images (on the left) and lfm images (on the right) of the a-c:h thin films deposited at various h/c ratios = 1 (a); 1.33 (b); 2 (c); 4 (d); and 10 (e) (scan area of 2 x 2 μm2).