Scanning transmission electron microscopy
Definition: A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50--150 kV is scanned across an electron-transparent specimen under vacuum and the intensities of the transmitted electrons are measured.
ID: CMO:0000086
Synonyms:
More about the RSC Chemical Methods Ontology (CMO)
Articles referencing this term
Lequan Liu, Botao Qiao, Zhengjian Chen, Juan Zhang and Youquan Deng, Chem. Commun., 2009
, 653
DOI: 10.1039/b816547e
Rafael Luque, James H. Clark, Kenta Yoshida and Pratibha L. Gai, Chem. Commun., 2009
, 5305
DOI: 10.1039/b911877b
Lourdes Garza-Ocañas, Domingo A. Ferrer, Justin Burt, Luis A. Diaz-Torres, Mónica Ramírez Cabrera, Victor Tamez Rodríguez, Rubén Luján Rangel, Dwight Romanovicz and Miguel Jose-Yacaman, Metallomics, 2010
, 2
, 204
DOI: 10.1039/b916107d
Zhanjun Gu, Feng Liu, Jane Y. Howe, M. Parans Paranthaman and Zhengwei Pan, Nanoscale, 2009
, 1
, 347
DOI: 10.1039/b9nr00040b
Martin Pumera and Yuji Miyahara, Nanoscale, 2009
, 1
, 260
DOI: 10.1039/b9nr00071b
Daniel R. Cooper and Jay L. Nadeau, Nanoscale, 2009
, 1
, 183
DOI: 10.1039/b9nr00132h
Alvaro Mayoral, Hector Barron, Ruben Estrada-Salas, Alma Vazquez-Duran and Miguel José-Yacamán, Nanoscale, 2010
, 2
, 335
DOI: 10.1039/b9nr00287a