# Copyright The Royal Society of Chemistry, 1999 # CCDC Number: 182/1232 data_gb2 _audit_creation_method SHELXL-97 _chemical_name_systematic ; ? ; _chemical_name_common ? _chemical_melting_point ? _chemical_formula_moiety ? _chemical_formula_sum 'C11 H27 F6 N3 S Si' _chemical_formula_weight 375.51 loop_ _atom_type_symbol _atom_type_description _atom_type_scat_dispersion_real _atom_type_scat_dispersion_imag _atom_type_scat_source 'C' 'C' 0.0033 0.0016 'International Tables Vol C Tables 4.2.6.8 and 6.1.1.4' 'H' 'H' 0.0000 0.0000 'International Tables Vol C Tables 4.2.6.8 and 6.1.1.4' 'N' 'N' 0.0061 0.0033 'International Tables Vol C Tables 4.2.6.8 and 6.1.1.4' 'F' 'F' 0.0171 0.0103 'International Tables Vol C Tables 4.2.6.8 and 6.1.1.4' 'Si' 'Si' 0.0817 0.0704 'International Tables Vol C Tables 4.2.6.8 and 6.1.1.4' 'S' 'S' 0.1246 0.1234 'International Tables Vol C Tables 4.2.6.8 and 6.1.1.4' _symmetry_cell_setting monoclinic _symmetry_space_group_name_H-M P2(1)/m loop_ _symmetry_equiv_pos_as_xyz 'x, y, z' '-x, y+1/2, -z' '-x, -y, -z' 'x, -y-1/2, z' _cell_length_a 7.698(2) _cell_length_b 11.321(2) _cell_length_c 11.356(2) _cell_angle_alpha 90.00 _cell_angle_beta 105.260(10) _cell_angle_gamma 90.00 _cell_volume 954.8(3) _cell_formula_units_Z 2 _cell_measurement_temperature 173(2) _cell_measurement_reflns_used 26 _cell_measurement_theta_min 3.604 _cell_measurement_theta_max 14.547 _exptl_crystal_description plates _exptl_crystal_colour colourless _exptl_crystal_size_max 0.50 _exptl_crystal_size_mid 0.40 _exptl_crystal_size_min 0.10 _exptl_crystal_density_meas ? _exptl_crystal_density_diffrn 1.306 _exptl_crystal_density_method 'not measured' _exptl_crystal_F_000 396 _exptl_absorpt_coefficient_mu 0.283 _exptl_absorpt_correction_type none _exptl_absorpt_correction_T_min 0.8713 _exptl_absorpt_correction_T_max 0.9722 _exptl_absorpt_process_details ? _exptl_special_details ; ? ; _diffrn_ambient_temperature 173(2) _diffrn_radiation_wavelength 0.71073 _diffrn_radiation_type MoK\a _diffrn_radiation_source 'normal-focus sealed tube' _diffrn_radiation_monochromator graphite _diffrn_measurement_device_type 'Siemens P4' _diffrn_measurement_method '2\q/\w scans' _diffrn_detector_area_resol_mean ? _diffrn_standards_number 3 _diffrn_standards_interval_count 197 _diffrn_standards_interval_time ? _diffrn_standards_decay_% 'random variation +/-2.0' _diffrn_reflns_number 6512 _diffrn_reflns_av_R_equivalents 0.0672 _diffrn_reflns_av_sigmaI/netI 0.0563 _diffrn_reflns_limit_h_min -9 _diffrn_reflns_limit_h_max 9 _diffrn_reflns_limit_k_min -13 _diffrn_reflns_limit_k_max 13 _diffrn_reflns_limit_l_min -13 _diffrn_reflns_limit_l_max 13 _diffrn_reflns_theta_min 2.59 _diffrn_reflns_theta_max 24.99 _reflns_number_total 1775 _reflns_number_gt 1279 _reflns_threshold_expression >2sigma(I) _computing_data_collection 'Siemens XSCANS' _computing_cell_refinement 'Siemens XSCANS' _computing_data_reduction 'Siemens XSCANS' _computing_structure_solution 'SHELXS-97 (Sheldrick, 1990)' _computing_structure_refinement 'SHELXL-97 (Sheldrick, 1997)' _computing_molecular_graphics 'Siemens SHELXTL' _computing_publication_material SHELXL-97 _refine_special_details ; The CH3-group with C(3) as central atom is disordered. Refinement of F^2^ against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F^2^, conventional R-factors R are based on F, with F set to zero for negative F^2^. The threshold expression of F^2^ > 2sigma(F^2^) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F^2^ are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger. ; _refine_ls_structure_factor_coef Fsqd _refine_ls_matrix_type full _refine_ls_weighting_scheme calc _refine_ls_weighting_details 'calc w=1/[\s^2^(Fo^2^)+(0.0345P)^2^+0.7269P] where P=(Fo^2^+2Fc^2^)/3' _atom_sites_solution_primary direct _atom_sites_solution_secondary difmap _atom_sites_solution_hydrogens geom _refine_ls_hydrogen_treatment refU _refine_ls_extinction_method SHELXL _refine_ls_extinction_coef 0.0103(18) _refine_ls_extinction_expression 'Fc^*^=kFc[1+0.001xFc^2^\l^3^/sin(2\q)]^-1/4^' _refine_ls_number_reflns 1775 _refine_ls_number_parameters 120 _refine_ls_number_restraints 0 _refine_ls_R_factor_all 0.0774 _refine_ls_R_factor_gt 0.0476 _refine_ls_wR_factor_ref 0.1157 _refine_ls_wR_factor_gt 0.1002 _refine_ls_goodness_of_fit_ref 1.064 _refine_ls_restrained_S_all 1.064 _refine_ls_shift/su_max 0.012 _refine_ls_shift/su_mean 0.002 loop_ _atom_site_label _atom_site_type_symbol _atom_site_fract_x _atom_site_fract_y _atom_site_fract_z _atom_site_U_iso_or_equiv _atom_site_adp_type _atom_site_occupancy _atom_site_symetry_multiplicity _atom_site_calc_flag _atom_site_refinement_flags _atom_site_disorder_assembly _atom_site_disorder_group Si1 Si 0.39681(14) 0.2500 0.81567(9) 0.0293(3) Uani 1 2 d S . . C1 C 0.3050(6) 0.2500 0.9701(4) 0.0457(11) Uani 1 2 d S . . F1 F 0.4374(4) 0.2500 1.0797(2) 0.0742(10) Uani 1 2 d S . . F2 F 0.2004(3) 0.15534(19) 0.98239(19) 0.0684(7) Uani 1 1 d . . . C2 C 0.4917(6) 0.2500 0.6619(4) 0.0476(12) Uani 1 2 d S . . F3 F 0.6751(3) 0.2500 0.6820(2) 0.0600(8) Uani 1 2 d S . . F4 F 0.4399(3) 0.1556(2) 0.58411(19) 0.0863(8) Uani 1 1 d . . . C3 C 0.1592(6) 0.2500 0.7155(4) 0.0602(15) Uani 1 2 d S . . H3A H 0.1502 0.3046 0.6472 0.051(12) Uiso 0.50 1 calc PR . . H3B H 0.0768 0.2752 0.7633 0.051(12) Uiso 0.50 1 calc PR . . H3C H 0.1270 0.1702 0.6838 0.051(12) Uiso 0.50 1 calc PR . . C4 C 0.5211(5) 0.1071(3) 0.8636(3) 0.0528(9) Uani 1 1 d . . . H4A H 0.6495 0.1186 0.8703 0.112(5) Uiso 1 1 calc R . . H4B H 0.4731 0.0460 0.8026 0.112(5) Uiso 1 1 calc R . . H4C H 0.5052 0.0824 0.9428 0.112(5) Uiso 1 1 calc R . . S1 S 1.01945(13) 0.2500 0.34694(8) 0.0325(3) Uani 1 2 d S . . N1 N 1.0218(4) 0.1298(3) 0.2719(2) 0.0525(8) Uani 1 1 d . . . C5 C 1.1961(5) 0.0742(4) 0.2896(4) 0.0716(12) Uani 1 1 d . . . H5A H 1.1820 -0.0118 0.2901 0.112(5) Uiso 1 1 calc R . . H5B H 1.2757 0.0998 0.3677 0.112(5) Uiso 1 1 calc R . . H5C H 1.2485 0.0969 0.2231 0.112(5) Uiso 1 1 calc R . . C6 C 0.8919(6) 0.1042(5) 0.1548(4) 0.0877(16) Uani 1 1 d . . . H6A H 0.9352 0.1377 0.0882 0.112(5) Uiso 1 1 calc R . . H6B H 0.7752 0.1392 0.1540 0.112(5) Uiso 1 1 calc R . . H6C H 0.8785 0.0185 0.1440 0.112(5) Uiso 1 1 calc R . . N2 N 0.8038(5) 0.2500 0.3518(3) 0.0543(11) Uani 1 2 d S . . C7 C 0.7590(5) 0.1417(4) 0.4109(4) 0.0825(14) Uani 1 1 d . . . H7A H 0.8281 0.1403 0.4967 0.112(5) Uiso 1 1 calc R . . H7B H 0.7891 0.0720 0.3690 0.112(5) Uiso 1 1 calc R . . H7C H 0.6300 0.1411 0.4060 0.112(5) Uiso 1 1 calc R . . loop_ _atom_site_aniso_label _atom_site_aniso_U_11 _atom_site_aniso_U_22 _atom_site_aniso_U_33 _atom_site_aniso_U_23 _atom_site_aniso_U_13 _atom_site_aniso_U_12 Si1 0.0302(6) 0.0337(7) 0.0263(6) 0.000 0.0116(4) 0.000 C1 0.051(3) 0.046(3) 0.046(2) 0.000 0.024(2) 0.000 F1 0.082(2) 0.111(3) 0.0320(14) 0.000 0.0193(14) 0.000 F2 0.0870(15) 0.0632(14) 0.0738(14) 0.0042(11) 0.0544(12) -0.0178(12) C2 0.040(3) 0.075(4) 0.030(2) 0.000 0.0114(18) 0.000 F3 0.0399(15) 0.096(2) 0.0527(16) 0.000 0.0267(12) 0.000 F4 0.0824(16) 0.133(2) 0.0528(12) -0.0489(14) 0.0338(11) -0.0268(15) C3 0.042(3) 0.096(5) 0.042(3) 0.000 0.011(2) 0.000 C4 0.061(2) 0.046(2) 0.059(2) 0.0101(17) 0.0293(17) 0.0144(17) S1 0.0293(5) 0.0424(7) 0.0274(5) 0.000 0.0103(4) 0.000 N1 0.0568(18) 0.0559(19) 0.0504(16) -0.0134(14) 0.0238(13) -0.0081(14) C5 0.098(3) 0.058(3) 0.074(3) 0.012(2) 0.049(2) 0.030(2) C6 0.077(3) 0.129(4) 0.064(3) -0.051(3) 0.032(2) -0.044(3) N2 0.032(2) 0.093(3) 0.043(2) 0.000 0.0195(17) 0.000 C7 0.080(3) 0.106(4) 0.079(3) -0.022(3) 0.052(2) -0.043(3) _geom_special_details ; All esds (except the esd in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell esds are taken into account individually in the estimation of esds in distances, angles and torsion angles; correlations between esds in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell esds is used for estimating esds involving l.s. planes. ; loop_ _geom_bond_atom_site_label_1 _geom_bond_atom_site_label_2 _geom_bond_distance _geom_bond_site_symmetry_2 _geom_bond_publ_flag Si1 C3 1.882(5) . ? Si1 C4 1.886(3) 4_565 ? Si1 C4 1.886(3) . ? Si1 C1 2.056(4) . ? Si1 C2 2.062(4) . ? C1 F2 1.369(3) . ? C1 F2 1.369(3) 4_565 ? C1 F1 1.386(5) . ? C2 F3 1.370(5) . ? C2 F4 1.377(3) 4_565 ? C2 F4 1.377(3) . ? S1 N1 1.608(3) 4_565 ? S1 N1 1.608(3) . ? S1 N2 1.675(4) . ? N1 C5 1.447(4) . ? N1 C6 1.467(4) . ? N2 C7 1.481(5) 4_565 ? N2 C7 1.481(5) . ? loop_ _geom_angle_atom_site_label_1 _geom_angle_atom_site_label_2 _geom_angle_atom_site_label_3 _geom_angle _geom_angle_site_symmetry_1 _geom_angle_site_symmetry_3 _geom_angle_publ_flag C3 Si1 C4 120.85(12) . 4_565 ? C3 Si1 C4 120.85(12) . . ? C4 Si1 C4 118.2(2) 4_565 . ? C3 Si1 C1 91.0(2) . . ? C4 Si1 C1 90.92(13) 4_565 . ? C4 Si1 C1 90.92(12) . . ? C3 Si1 C2 89.6(2) . . ? C4 Si1 C2 88.77(12) 4_565 . ? C4 Si1 C2 88.77(12) . . ? C1 Si1 C2 179.40(19) . . ? F2 C1 F2 103.0(3) . 4_565 ? F2 C1 F1 102.8(3) . . ? F2 C1 F1 102.8(3) 4_565 . ? F2 C1 Si1 115.5(2) . . ? F2 C1 Si1 115.5(2) 4_565 . ? F1 C1 Si1 115.4(3) . . ? F3 C2 F4 102.6(2) . 4_565 ? F3 C2 F4 102.6(2) . . ? F4 C2 F4 101.8(4) 4_565 . ? F3 C2 Si1 116.0(3) . . ? F4 C2 Si1 115.8(2) 4_565 . ? F4 C2 Si1 115.8(2) . . ? N1 S1 N1 115.6(2) 4_565 . ? N1 S1 N2 99.62(12) 4_565 . ? N1 S1 N2 99.62(12) . . ? C5 N1 C6 115.2(3) . . ? C5 N1 S1 115.7(2) . . ? C6 N1 S1 123.2(3) . . ? C7 N2 C7 111.7(4) 4_565 . ? C7 N2 S1 111.5(2) 4_565 . ? C7 N2 S1 111.5(2) . . ? _diffrn_measured_fraction_theta_max 0.998 _diffrn_reflns_theta_full 24.99 _diffrn_measured_fraction_theta_full 0.998 _refine_diff_density_max 0.264 _refine_diff_density_min -0.244 _refine_diff_density_rms 0.054