# Supplementary Material (ESI) for Chemical Communications # This journal is © The Royal Society of Chemistry 2005 data_global #------------------ AUDIT DETAILS -------------------------------------------# _audit_creation_date 2005-07-04 _audit_creation_method 'WinGX routine CIF_UPDATE' _audit_conform_dict_name cif_core.dic _audit_conform_dict_version 2.3 _audit_conform_dict_location ftp://ftp.iucr.org/pub/cif_core.dic _audit_update_record ? _journal_coden_Cambridge 182 loop_ _publ_author_name 'Philippe Leriche' 'Philippe Blanchard' 'Pierre Frere' 'Eric Levillain' 'Gilles Mabon' 'J. Roncali' _publ_contact_author_name 'Philippe Leriche' _publ_contact_author_address ; Groupe Systemes Conjugues Lineaires, CIMMA UMR CNRS 6200 Universite d'Angers UFR Sciences, 2, Bd Lavoisier Angers 49045 FRANCE ; _publ_contact_author_email PHILIPPE.LERICHE@UNIV-ANGERS.FR _publ_requested_journal 'Chemical Communications' _publ_section_title ; 3,4-Vinylenedioxythiophene (VDOT): a new building block for thiophene-based pi-conjugated systems ; # Insert blank lines between references _publ_section_references ; Allen, F.H., Kennard, O. & Taylor, R. (1983). Acc. Chem. Res. 16, 146-153. Altomare, A., Cascarano, G., Giacovazzo, C. & Guagliardi, A. (1993) J. Appl. Cryst. 26, 343-350. Altomare, A. Burla, M. C., Camalli, M., Cascarano, G. L., Giacovazzo, C., Guagliardi, A., Moliterni, A. G. G., Polidori, G. & Spagna, R. (1999) J. Appl. Cryst. 32, 115-119. Blessing, R. H. (1995) Acta Cryst., A51, 33-38. Blessing, R. H. (1987) Cryst. Rev. 1, 3-58. Blessing, R. H. (1989) J. Appl. Cryst. 22, 396-397. Beurskens, P.T., Beurskens, G., de Gelder, R., Garciia-Granda, S., Gould, R.O., Israel, R. & Smits, J.M.M. (1999) The DIRDIF-99 program system, Technical Report of the Crystallography Laboratory, University of Nijmegen, The Netherlands. Cremer, D. & Pople, J.A. (1975). J. Am. Chem. Soc. 97, 1354-1358. Enraf-Nonius (1994). CAD4Express Software. Enraf-Nonius, Delft, The Netherlands. Farrugia, L. J. (1997) ORTEP-3 for Windows, J. Appl. Cryst. 30, 565. Farrugia, L. J. (1999) WinGX, J. Appl. Cryst. 32, 837-838. Flack, H.D. (1983). Acta Cryst. A39, 876-881. Harms, K. & Wocadlo, S. (1995) XCAD-4. Program for Processing CAD-4 Diffractometer Data. University of Marburg, Germany. Johnson, C.K. (1965). ORTEP. Report ORNL-3794. Oak Ridge National Laboratory, Tennessee, USA. Lehman, M. S. and Larsen, F. K. (1974) Acta. Cryst. A30, 580 LePage, Y. (1987). J. Appl. Cryst. 20, 264-269. North, A. C. T., Phillips, D. C. & Mathews, F. S. (1968) Acta Cryst, A24, 351-359 Orpen, A. G., Brammer, L., Allen, F. H., Kennard, O., Watson, D. G., & Taylor, R. (1992). International Tables for Crystallography, Volume C. Sheldrick, G.M. (1993) SHELXL93. Program for crystal structure refinement. University of Gottingen, Germany. Sheldrick, G.M. (1997) SHELXL97. Program for crystal structure refinement. University of Gottingen, Germany. Sheldrick, G.M. (1985). SHELXS86. In Crystallographic Computing 3, edited by G. M. Sheldrick, C. Kruger & R. Goddard, pp. 175-189. Oxford University Press. Sheldrick, G.M. (1997) SHELXS97. Program for Crystal Structure solution. University of Gottingen, Germany. Spek, A.L. (1990). Acta Cryst. A46, C34 Streltsov, V. A. & Zavodnik, V. E. (1989) Sov. Phys. Crystallogr. 34, 824-828 Streltsov, V. A. & Zavodnik, V. E. (1990) Sov. Phys. Crystallogr. 35, 281. Walker, N. & Stuart, D. (1983). Acta Cryst., A39, 158 - 166. Wilson, A.J.C. (1992) Ed. International Tables for Crystallography, Volume C, Kluwer Academic Publishers, Dordrecht, The Netherlands. ; _publ_section_figure_captions ; Figure 1. View of (I) (50% probability displacement ellipsoids) ; _publ_section_acknowledgements ; ? ; _publ_section_table_legends ; Table 1. Fractional atomic coordinates and equivalent isotropic displacement parameters (\%A^2^) Table 2. Selected geometric parameters (\%A ,\% ) ; #------------------ SECTION 2. COMPOUND(S) DETAILS -------------------------# data_plng16 _database_code_depnum_ccdc_archive 'CCDC 285541' _audit_creation_date 2005-07-04T13:46:45-00:00 _audit_creation_method 'WinGX routine CIF_UPDATE' #------------------ CHEMICAL INFORMATION ------------------------------------# _chemical_formula_moiety 'C6 H3 O2 S1' _chemical_formula_sum 'C6 H3 O2 S' _chemical_formula_weight 139.14 #------------------ UNIT CELL INFORMATION -----------------------------------# _symmetry_cell_setting monoclinic _symmetry_space_group_name_H-M 'P 1 21/n 1' _symmetry_space_group_name_Hall '-P 2yn' loop_ _symmetry_equiv_pos_as_xyz 'x, y, z' '-x+1/2, y+1/2, -z+1/2' '-x, -y, -z' 'x-1/2, -y-1/2, z-1/2' _cell_length_a 7.0000(10) _cell_length_b 4.8894(6) _cell_length_c 15.815(3) _cell_angle_alpha 90 _cell_angle_beta 94.88(2) _cell_angle_gamma 90 _cell_volume 539.32(14) _cell_formula_units_Z 4 _cell_measurement_temperature 293(2) _cell_measurement_reflns_used 3548 _cell_measurement_theta_min 2.6 _cell_measurement_theta_max 25.85 #------------------ CRYSTAL INFORMATION -------------------------------------# _exptl_crystal_description needle _exptl_crystal_colour colorless _exptl_crystal_size_max 0.78 _exptl_crystal_size_mid 0.09 _exptl_crystal_size_min 0.05 _exptl_crystal_density_diffrn 1.714 _exptl_crystal_density_method 'not measured' _exptl_crystal_F_000 284 _exptl_absorpt_coefficient_mu 0.495 _exptl_absorpt_correction_type multi-scan _exptl_absorpt_correction_T_min 0.8165 _exptl_absorpt_correction_T_max 0.8812 _exptl_absorpt_process_details ; [c.f. r.h. blessing, acta cryst. (1995), a51, 33-38] ; #------------------ DATA COLLECTION INFORMATION -----------------------------# _diffrn_radiation_wavelength 0.71073 _diffrn_radiation_type MoK\a _diffrn_radiation_probe x-ray _diffrn_measurement_device_type 'STOE IPDS' _diffrn_measurement_method 'Oscillation Phi Incr 1.5 deg' _diffrn_detector_area_resol_mean 6.66 _diffrn_reflns_number 4988 _diffrn_reflns_av_R_equivalents 0.0789 _diffrn_reflns_limit_h_min -8 _diffrn_reflns_limit_h_max 8 _diffrn_reflns_limit_k_min -5 _diffrn_reflns_limit_k_max 5 _diffrn_reflns_limit_l_min -19 _diffrn_reflns_limit_l_max 19 _diffrn_reflns_theta_min 2.59 _diffrn_reflns_theta_max 26.01 _diffrn_reflns_theta_full 26.01 _diffrn_measured_fraction_theta_max 0.941 _diffrn_measured_fraction_theta_full 0.941 _reflns_number_total 997 _reflns_number_gt 712 _reflns_threshold_expression >2sigma(I) #------------------ COMPUTER PROGRAMS USED ----------------------------------# _computing_data_collection 'EXPOSE, STOE IPDS' _computing_cell_refinement 'SELECT,CELL, STOE IPDS' _computing_data_reduction 'INTEGRATE, STOE IPDS' _computing_structure_solution 'SHELXS-97 (Sheldrick, 1997)' _computing_structure_refinement 'SHELXL-97 (Sheldrick, 1997)' _computing_molecular_graphics 'DIAMOND 3.0d (Crystal Impact GbR 2004)' _computing_publication_material 'WinGX publication routines (Farrugia, 1999)' #------------------ REFINEMENT INFORMATION ----------------------------------# _refine_ls_structure_factor_coef Fsqd _refine_ls_matrix_type full _refine_ls_weighting_scheme calc _refine_ls_weighting_details 'calc w=1/[\s^2^(Fo^2^)+(0.0479P)^2^+0.0000P] where P=(Fo^2^+2Fc^2^)/3' _refine_ls_hydrogen_treatment refall _refine_ls_extinction_method none _refine_ls_number_reflns 997 _refine_ls_number_parameters 94 _refine_ls_number_restraints 0 _refine_ls_R_factor_gt 0.0446 _refine_ls_wR_factor_ref 0.0963 _refine_ls_goodness_of_fit_ref 1.058 _refine_ls_restrained_S_all 1.058 _refine_ls_shift/su_max 0 _refine_diff_density_max 0.276 _refine_diff_density_min -0.252 #------------------ ATOMIC TYPES, COORDINATES AND THERMAL PARAMETERS --------# loop_ _atom_type_symbol _atom_type_description _atom_type_scat_dispersion_real _atom_type_scat_dispersion_imag _atom_type_scat_source C C 0.0033 0.0016 'International Tables Vol C Tables 4.2.6.8 and 6.1.1.4' H H 0 0 'International Tables Vol C Tables 4.2.6.8 and 6.1.1.4' O O 0.0106 0.006 'International Tables Vol C Tables 4.2.6.8 and 6.1.1.4' S S 0.1246 0.1234 'International Tables Vol C Tables 4.2.6.8 and 6.1.1.4' loop_ _atom_site_label _atom_site_type_symbol _atom_site_fract_x _atom_site_fract_y _atom_site_fract_z _atom_site_U_iso_or_equiv _atom_site_adp_type _atom_site_occupancy _atom_site_calc_flag _atom_site_refinement_flags _atom_site_disorder_group _atom_site_disorder_assembly H04 H 0.792(5) 0.350(7) 0.709(2) 0.046(9) Uiso 1 d . . . H05 H 0.197(4) 0.805(8) 0.691(2) 0.039(9) Uiso 1 d . . . H06 H 0.041(5) 0.583(7) 0.572(2) 0.041(9) Uiso 1 d . . . C01 C 0.5279(3) 0.0826(6) 0.53691(17) 0.0276(6) Uani 1 d . . . C02 C 0.4233(3) 0.2738(6) 0.57548(17) 0.0277(7) Uani 1 d . . . C03 C 0.5209(4) 0.3981(7) 0.64687(17) 0.0298(7) Uani 1 d . . . C04 C 0.6999(4) 0.3014(7) 0.6640(2) 0.0363(7) Uani 1 d . . . C05 C 0.2527(4) 0.6617(8) 0.6610(2) 0.0383(8) Uani 1 d . . . C06 C 0.1626(4) 0.5465(7) 0.5948(2) 0.0386(8) Uani 1 d . . . O01 O 0.4385(3) 0.5978(5) 0.69391(13) 0.0379(5) Uani 1 d . . . O02 O 0.2381(3) 0.3431(5) 0.54669(14) 0.0379(6) Uani 1 d . . . S01 S 0.75309(10) 0.05704(18) 0.59217(5) 0.0353(3) Uani 1 d . . . loop_ _atom_site_aniso_label _atom_site_aniso_U_11 _atom_site_aniso_U_22 _atom_site_aniso_U_33 _atom_site_aniso_U_23 _atom_site_aniso_U_13 _atom_site_aniso_U_12 C01 0.0255(12) 0.0246(18) 0.0324(14) 0.0006(12) 0.0012(10) -0.0012(11) C02 0.0261(13) 0.0293(19) 0.0275(14) 0.0024(12) 0.0014(10) -0.0005(11) C03 0.0335(13) 0.027(2) 0.0284(15) -0.0010(12) 0.0025(11) -0.0019(11) C04 0.0355(15) 0.036(2) 0.0350(17) -0.0038(14) -0.0080(12) 0.0001(13) C05 0.0393(15) 0.035(2) 0.0418(18) -0.0022(15) 0.0090(13) 0.0078(14) C06 0.0313(14) 0.041(2) 0.0443(18) -0.0039(16) 0.0056(13) 0.0090(14) O01 0.0399(11) 0.0359(15) 0.0374(11) -0.0127(10) 0.0008(9) 0.0040(9) O02 0.0284(10) 0.0398(15) 0.0441(12) -0.0117(10) -0.0045(8) 0.0106(8) S01 0.0282(3) 0.0344(5) 0.0418(4) -0.0047(4) -0.0061(3) 0.0061(3) #------------------ MOLECULAR GEOMETRY --------------------------------------# _geom_special_details ; All esds (except the esd in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell esds are taken into account individually in the estimation of esds in distances, angles and torsion angles; correlations between esds in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell esds is used for estimating esds involving l.s. planes. ; loop_ _geom_bond_atom_site_label_1 _geom_bond_atom_site_label_2 _geom_bond_distance _geom_bond_site_symmetry_2 _geom_bond_publ_flag C01 C02 1.363(4) . ? C01 C01 1.446(6) 3_656 ? C01 S01 1.740(2) . ? C02 O02 1.379(3) . ? C02 C03 1.407(4) . ? C03 C04 1.346(4) . ? C03 O01 1.383(4) . ? C04 S01 1.711(3) . ? C04 H04 0.95(3) . ? C05 C06 1.302(5) . ? C05 O01 1.395(3) . ? C05 H05 0.95(4) . ? C06 O02 1.385(4) . ? C06 H06 0.91(3) . ? loop_ _geom_angle_atom_site_label_1 _geom_angle_atom_site_label_2 _geom_angle_atom_site_label_3 _geom_angle _geom_angle_site_symmetry_1 _geom_angle_site_symmetry_3 _geom_angle_publ_flag C02 C01 C01 128.7(3) . 3_656 ? C02 C01 S01 108.8(2) . . ? C01 C01 S01 122.4(3) 3_656 . ? C01 C02 O02 123.1(2) . . ? C01 C02 C03 114.4(2) . . ? O02 C02 C03 122.5(3) . . ? C04 C03 O01 124.3(3) . . ? C04 C03 C02 112.9(3) . . ? O01 C03 C02 122.7(2) . . ? C03 C04 S01 111.3(2) . . ? C03 C04 H04 128(2) . . ? S01 C04 H04 120(2) . . ? C06 C05 O01 125.1(3) . . ? C06 C05 H05 122.3(19) . . ? O01 C05 H05 112.6(19) . . ? C05 C06 O02 124.8(3) . . ? C05 C06 H06 127(2) . . ? O02 C06 H06 108(2) . . ? C03 O01 C05 112.0(2) . . ? C02 O02 C06 112.8(2) . . ? C04 S01 C01 92.54(14) . . ?