# Supplementary Material (ESI) for CrystEngComm


data_global

_publ_contact_author_email       yqguo828@163.com

_publ_contact_author_name        'Dr Y. Q. Guo'

_publ_contact_author_address     
;
Ningbo Institute of Material Technology and Engineering,
Chinese Academy of Sciences
Ningbo 315201
People's Republic of China
;

_publ_section_title              
;
Shape-controlled growth and single-crystal XRD study of submillimeter-sized single crystals of SnO
;

loop_
_publ_author_name
'Y. Q. Guo'


data_x1 
 
_audit_creation_method            SHELXL-97 
_chemical_name_systematic 
; 
 ? 
; 
_chemical_name_common             ? 
_chemical_melting_point           ? 
_chemical_formula_moiety          ? 
_chemical_formula_sum             'O Sn' 
_chemical_formula_weight          134.69 
 
loop_ 
 _atom_type_symbol 
 _atom_type_description 
 _atom_type_scat_dispersion_real 
 _atom_type_scat_dispersion_imag 
 _atom_type_scat_source 
 'O'  'O'   0.0106   0.0060 
 'International Tables Vol C Tables 4.2.6.8 and 6.1.1.4' 
 'Sn'  'Sn'  -0.6537   1.4246 
 'International Tables Vol C Tables 4.2.6.8 and 6.1.1.4' 
 
_symmetry_cell_setting            Tetragonal 
_symmetry_space_group_name_H-M    P4/nmm 
 
loop_ 
 _symmetry_equiv_pos_as_xyz 
 'x, y, z' 
 '-x+1/2, -y+1/2, z' 
 '-y+1/2, x, z' 
 'y, -x+1/2, z' 
 '-x, y+1/2, -z' 
 'x+1/2, -y, -z' 
 'y+1/2, x+1/2, -z' 
 '-y, -x, -z' 
 '-x, -y, -z' 
 'x-1/2, y-1/2, -z' 
 'y-1/2, -x, -z' 
 '-y, x-1/2, -z' 
 'x, -y-1/2, z' 
 '-x-1/2, y, z' 
 '-y-1/2, -x-1/2, z' 
 'y, x, z' 
 
_cell_length_a                    3.8494(19) 
_cell_length_b                    3.8494(19) 
_cell_length_c                    4.894(5) 
_cell_angle_alpha                 90.00 
_cell_angle_beta                  90.00 
_cell_angle_gamma                 90.00 
_cell_volume                      72.51(9) 
_cell_formula_units_Z             2 
_cell_measurement_temperature     296(2) 
_cell_measurement_reflns_used     ? 
_cell_measurement_theta_min       ? 
_cell_measurement_theta_max       ? 
 
_exptl_crystal_description        plate 
_exptl_crystal_colour             black 
_exptl_crystal_size_max           0.30 
_exptl_crystal_size_mid           0.30 
_exptl_crystal_size_min           0.03 
_exptl_crystal_density_meas       ? 
_exptl_crystal_density_diffrn     6.169 
_exptl_crystal_density_method     'not measured' 
_exptl_crystal_F_000              116 
_exptl_absorpt_coefficient_mu     16.942 
_exptl_absorpt_correction_type    ? 
_exptl_absorpt_correction_T_min   ? 
_exptl_absorpt_correction_T_max   ? 
_exptl_absorpt_process_details    ? 
 
_exptl_special_details 
; 
 ? 
; 
 
_diffrn_ambient_temperature       296(2) 
_diffrn_radiation_wavelength      0.71073 
_diffrn_radiation_type            MoK\a 
_diffrn_radiation_source          'fine-focus sealed tube' 
_diffrn_radiation_monochromator   graphite 
_diffrn_measurement_device_type   'Bruker SMART APEX-II CCD area detector' 
_diffrn_measurement_method        'phi and omega scans'
_diffrn_detector_area_resol_mean  ? 
_diffrn_standards_number          ? 
_diffrn_standards_interval_count  ? 
_diffrn_standards_interval_time   ? 
_diffrn_standards_decay_%         ? 
_diffrn_reflns_number             451 
_diffrn_reflns_av_R_equivalents   0.0837 
_diffrn_reflns_av_sigmaI/netI     0.0407 
_diffrn_reflns_limit_h_min        -4 
_diffrn_reflns_limit_h_max        4 
_diffrn_reflns_limit_k_min        -4 
_diffrn_reflns_limit_k_max        4 
_diffrn_reflns_limit_l_min        -5 
_diffrn_reflns_limit_l_max        6 
_diffrn_reflns_theta_min          4.16 
_diffrn_reflns_theta_max          27.06 
_reflns_number_total              62 
_reflns_number_gt                 62 
_reflns_threshold_expression      >2sigma(I) 
 
_computing_data_collection        ?  
_computing_cell_refinement        ? 
_computing_data_reduction         ? 
_computing_structure_solution     'SHELXS-97 (Sheldrick, 1990)' 
_computing_structure_refinement   'SHELXL-97 (Sheldrick, 1997)' 
_computing_molecular_graphics     ? 
_computing_publication_material   ? 
 
_refine_special_details 
; 
 Refinement of F² against ALL reflections.  The weighted R-factor wR and 
 goodness of fit S are based on F², conventional R-factors R are based 
 on F, with F set to zero for negative F². The threshold expression of 
 F² > 2sigma(F²) is used only for calculating R-factors(gt) etc. and is 
 not relevant to the choice of reflections for refinement.  R-factors based 
 on F² are statistically about twice as large as those based on F, and R- 
 factors based on ALL data will be even larger. 
; 
 
_refine_ls_structure_factor_coef  Fsqd  
_refine_ls_matrix_type            full 
_refine_ls_weighting_scheme       calc  
_refine_ls_weighting_details 
 'calc w=1/[σ²(Fo²)+(0.0600P)²+0.0000P] where P=(Fo²+2Fc²)/3' 
_atom_sites_solution_primary      direct 
_atom_sites_solution_secondary    difmap 
_atom_sites_solution_hydrogens    none 
_refine_ls_hydrogen_treatment     none 
_refine_ls_extinction_method      SHELXL 
_refine_ls_extinction_coef        0.91(15) 
_refine_ls_extinction_expression 
 'Fc^*^=kFc[1+0.001xFc²λ³/sin(2θ)]^-1/4^' 
_refine_ls_number_reflns          62 
_refine_ls_number_parameters      7 
_refine_ls_number_restraints      0 
_refine_ls_R_factor_all           0.0449 
_refine_ls_R_factor_gt            0.0449 
_refine_ls_wR_factor_ref          0.0966 
_refine_ls_wR_factor_gt           0.0966 
_refine_ls_goodness_of_fit_ref    1.407 
_refine_ls_restrained_S_all       1.407 
_refine_ls_shift/su_max           0.000 
_refine_ls_shift/su_mean          0.000 
 
loop_ 
 _atom_site_label 
 _atom_site_type_symbol 
 _atom_site_fract_x 
 _atom_site_fract_y 
 _atom_site_fract_z 
 _atom_site_U_iso_or_equiv 
 _atom_site_adp_type 
 _atom_site_occupancy 
 _atom_site_symmetry_multiplicity 
 _atom_site_calc_flag 
 _atom_site_refinement_flags 
 _atom_site_disorder_assembly 
 _atom_site_disorder_group 
Sn1 Sn 0.2500 0.2500 0.2377(2) 0.0101(10) Uani 1 8 d S . . 
O1 O 0.7500 0.2500 0.0000 0.012(2) Uani 1 8 d S . . 
 
loop_ 
 _atom_site_aniso_label 
 _atom_site_aniso_U_11 
 _atom_site_aniso_U_22 
 _atom_site_aniso_U_33 
 _atom_site_aniso_U_23 
 _atom_site_aniso_U_13 
 _atom_site_aniso_U_12 
Sn1 0.0106(11) 0.0106(11) 0.0091(12) 0.000 0.000 0.000 
O1 0.008(2) 0.008(2) 0.021(5) 0.000 0.000 0.000 
 
_geom_special_details 
; 
 All esds (except the esd in the dihedral angle between two l.s. planes) 
 are estimated using the full covariance matrix.  The cell esds are taken 
 into account individually in the estimation of esds in distances, angles 
 and torsion angles; correlations between esds in cell parameters are only 
 used when they are defined by crystal symmetry.  An approximate (isotropic) 
 treatment of cell esds is used for estimating esds involving l.s. planes. 
; 
 
loop_ 
 _geom_bond_atom_site_label_1 
 _geom_bond_atom_site_label_2 
 _geom_bond_distance 
 _geom_bond_site_symmetry_2 
 _geom_bond_publ_flag 
Sn1 O1 2.2489(11) 9_655 ? 
Sn1 O1 2.2489(11) 1_455 ? 
Sn1 O1 2.2489(11) 9_665 ? 
Sn1 O1 2.2489(11) . ? 
O1 Sn1 2.2489(11) 9_655 ? 
O1 Sn1 2.2489(11) 1_655 ? 
O1 Sn1 2.2489(11) 9_665 ? 
 
loop_ 
 _geom_angle_atom_site_label_1 
 _geom_angle_atom_site_label_2 
 _geom_angle_atom_site_label_3 
 _geom_angle 
 _geom_angle_site_symmetry_1 
 _geom_angle_site_symmetry_3 
 _geom_angle_publ_flag 
O1 Sn1 O1 74.48(3) 9_655 1_455 ? 
O1 Sn1 O1 117.71(7) 9_655 9_665 ? 
O1 Sn1 O1 74.48(3) 1_455 9_665 ? 
O1 Sn1 O1 74.48(3) 9_655 . ? 
O1 Sn1 O1 117.71(7) 1_455 . ? 
O1 Sn1 O1 74.48(3) 9_665 . ? 
Sn1 O1 Sn1 105.52(3) 9_655 1_655 ? 
Sn1 O1 Sn1 117.71(7) 9_655 9_665 ? 
Sn1 O1 Sn1 105.52(3) 1_655 9_665 ? 
Sn1 O1 Sn1 105.52(3) 9_655 . ? 
Sn1 O1 Sn1 117.71(7) 1_655 . ? 
Sn1 O1 Sn1 105.52(3) 9_665 . ? 
 
_diffrn_measured_fraction_theta_max    0.984 
_diffrn_reflns_theta_full              27.06 
_diffrn_measured_fraction_theta_full   0.984 
_refine_diff_density_max    2.307 
_refine_diff_density_min   -2.134 
_refine_diff_density_rms    0.884 
