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Caption : supplementary fig. s1. schematic representation of the custom-built hot-wall cvd reactor used for ag nanoparticle deposition.

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Caption : supplementary fig. s2. comparison of the morphology and topography of naldi plate no. 2. sem images (50,000×, 200,000×) and afm maps (10 µm, 5 µm) of the surface: top - al₂o₃-coated steel substrate before ag deposition, bottom - al₂o₃ layer coated with silver nanoparticles (al₂o₃ + agnps).

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Caption : supplementary fig. s3. comparison of the morphology and topography of naldi plate no. 3. sem images (50,000×, 200,000×) and afm maps (10 µm, 5 µm) of the surface: top - al₂o₃-coated steel substrate before ag deposition, bottom - al₂o₃ layer coated with silver nanoparticles (al₂o₃ + agnps).

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Caption : supplementary fig. s4. edx analysis of plate 2.

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Caption : supplementary fig. s5. edx analysis of plate 3.

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Caption : supplementary fig. s6. sem images of the surface areas selected for edx analysis for plates 1, 2, and 3. the marked points and areas correspond to the locations where the edx measurements were performed.

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Caption : supplementary fig. s7. xps characterization of the al₂o₃ sample (plate 2): (a) survey spectrum; (b) o 1s high-resolution spectrum; (c) c 1s high-resolution spectrum; and (d) al 2p high-resolution spectrum.

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Caption : supplementary fig. s8. xps characterization of the al₂o₃ + ag sample (plate 2): (a) survey spectrum; (b) ag 3d high-resolution spectrum; (c) o 1s high-resolution spectrum; (d) c 1s high-resolution spectrum; and (e) al 2s/2p region.

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Caption : supplementary fig. s9. xps characterization of the al₂o₃ sample (plate 3): (a) survey spectrum; (b) o 1s high-resolution spectrum; (c) c 1s high-resolution spectrum; and (d) al 2p high-resolution spectrum.

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Caption : supplementary fig. s10. xps characterization of the al₂o₃ + ag sample (plate 3): (a) survey spectrum; (b) ag 3d high-resolution spectrum; (c) o 1s high-resolution spectrum; (d) c 1s high-resolution spectrum; and (e) al 2s/2p region.

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Caption : supplementary fig. s11. uv-vis drs spectra of samples (a) al₂o₃ and (b) al₂o₃ + agnps for plate 2.

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Caption : supplementary fig. s12. uv-vis drs spectra of samples (a) al₂o₃ and (b) al₂o₃ + agnps for plate 3.

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Caption : supplementary fig. s13. sem images of the steel substrate surface before deposition of the al₂o₃ layer.

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Caption : supplementary fig. s14.  afm image of the surface topography of stainless steel (scan area 2 × 2 µm²).

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Caption : supplementary fig. s15. sem images of the reference sample (si chip coated with an al₂o₃ layer) recorded at different magnifications.

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Caption : supplementary fig. s16. afm image of the surface topography of an al₂o₃ thin film deposited on a si substrate by atomic layer deposition (ald) (scan area 2 × 2 µm²).

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Caption : supplementary fig. s17. edx elemental mapping of the reference sample (si chip coated with an al₂o₃ layer), including: (a) composite elemental map, (b) o map, (c) al map, and (d) si map.

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Caption : supplementary fig. s18. edx spectrum and average atomic composition of the reference sample (si chip coated with an al₂o₃ layer).

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Caption : supplementary fig. s19. xps spectra of the reference sample: survey spectrum and high-resolution al 2p, o 1s, 
and c 1s spectra.