Topic: Advanced Structural Probes

New and powerful analysis techniques for probing the structure & properties of materials are continually under development. This session highlighted some of the most recent exciting developments in materials characterisation.

Session: Advanced Structural Probes - Monday 2 July (am)

Carbon Nanotube Atomic Force Microscopy Probes for Advanced Imaging Applications 
Julie MacPherson
University of Warwick, UK

Invited
Des McMorrow
University College London, UK

High-throughput structure/function screening of materials with multiple spectroscopic techniques 
Moniek Tromp*, Sergio Russu, Andy J Dent, J Fred Mosselmans, Ian Harvey, Shu Hayama, Andrea E Russell, Sam Guerin, Brian E Hayden, Ken Meacham, Panagiotis Melas, Mike Surridge, Jeremy G Frey, Nikolaos Tsapatsaris, Angela M Beesley,  Sven M L Schroeder and John Evans 
University of Southampton, UK

Invited
Paul Barnes
Birbeck College London, UK

Invited
David McComb
Imperial College London, UK

Energy-dependent small-angle x-ray scattering - Probing the gelation and calcination of zirconia-silica gels with chemical selectivity
Rudolf Winter*, Andrew Lyons and Daniel Le Messurier
University of Wales Aberystwyth, UK

Ab initio computation of low-temperature phase diagrams
J C Schön*, I Pentin and M Jansen
Max-Planck-Institute for Solid State Research, Germany