Issue 27, 2009
From the journal:

Physical Chemistry Chemical Physics

Defect structure in lithium-doped polymer-derived SiCN ceramics characterized by Raman and electron paramagnetic resonance spectroscopy

Emre Erdem,ab   Valentina Mass,bc   Armin Gembus,bd   Armin Schulz,e   Verena Liebau-Kunzmann,f   Claudia Fasel,f   Ralf Riedelf  and  Rüdiger-A. Eichel*ab  

* Corresponding authors

a Institut für Physikalische Chemie I, Universität Freiburg, Freiburg, Germany

b Eduard-Zintl-Institut, Technische Universität Darmstadt, Darmstadt, Germany
E-mail: r.eichel@physchem.uni-freiburg.de
Fax: +49 (0)761 2036215

c Deutsches Kunststoff-Institut, Darmstadt, Germany

d Bruker Optik GmbH, Ettlingen, Germany

e Max Planck Institute for Solid State Research, Stuttgart, Germany

f Institute of Materials Science, Technische Universität Darmstadt, Darmstadt, Germany

Abstract

Lithium-doped polymer-derived silicon carbonitride ceramics (SiCN : Li) synthesized at various pyrolysis temperatures, have been investigated by means of multifrequency and multipulse electron paramagnetic resonance (EPR) and Raman spectroscopy in order to determine different defect states that may impact the materials electronic properties. In particular, carbon- and silicon-based ‘dangling bonds’ at elevated, as well as metallic networks containing Li0 in the order of 1 μm at low pyrolysis temperatures have been observed in concentrations ranging between 1014 and 1017 spins mg−1.

Graphical abstract: Defect structure in lithium-doped polymer-derived SiCN ceramics characterized by Raman and electron paramagnetic resonance spectroscopy

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Article information

DOI
https://doi.org/10.1039/B822457A
Article type
Paper
Submitted
16 Dec 2008
Accepted
25 Mar 2009
First published
05 May 2009

Phys. Chem. Chem. Phys., 2009,11, 5628-5633

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Defect structure in lithium-doped polymer-derived SiCN ceramics characterized by Raman and electron paramagnetic resonance spectroscopy

E. Erdem, V. Mass, A. Gembus, A. Schulz, V. Liebau-Kunzmann, C. Fasel, R. Riedel and Rüdiger-A. Eichel, Phys. Chem. Chem. Phys., 2009, 11, 5628 DOI: 10.1039/B822457A

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