Issue 15, 2008
From the journal:

Journal of Materials Chemistry

Soft X-ray spectroscopy study of electronic structure in the organic semiconductor titanyl phthalocyanine (TiO-Pc)

Yufeng Zhang,a   Shancai Wang,a   Alex Demasi,a   Ian Reid,a   L. F. J. Piper,a   A. Y. Matsuura,b   James. E. Downesc  and  Kevin E. Smith.*a  

* Corresponding authors

a Department of Physics, Boston University, 590 Commonwealth Ave, Boston, MA 02215, USA

b In-Q-Tel, Arlington, VA 22201, USA

c Physics Department, Macquarie University, NSW 2109, Australia

Abstract

The electronic structure of the organic semiconductor titanyl phthalocyanine (TiO-Pc) has been investigated using synchrotron radiation-excited X-ray emission and absorption spectroscopies. The C and N K-edge spectra display similarities with those recorded from other metal-Pcs, while the O K-edge and Ti L-edge spectra support the premise that the titanyl species are spatially isolated. Good agreement is found between a calculation of the partial density of states and the measured spectra, although the Ti L-edge spectra differ from a previous study. Two energy loss features are reported from resonant X-ray inelastic scattering at the TiL-edge associated with O 2p–Ti 3d* and N 2p–Ti 3d* charge transfer transitions.

Graphical abstract: Soft X-ray spectroscopy study of electronic structure in the organic semiconductor titanyl phthalocyanine (TiO-Pc)

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Article information

DOI
https://doi.org/10.1039/B717224A
Article type
Paper
Submitted
07 Nov 2007
Accepted
05 Feb 2008
First published
28 Feb 2008

J. Mater. Chem., 2008,18, 1792-1798

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Soft X-ray spectroscopy study of electronic structure in the organic semiconductor titanyl phthalocyanine (TiO-Pc)

Y. Zhang, S. Wang, A. Demasi, I. Reid, L. F. J. Piper, A. Y. Matsuura, James. E. Downes and K. E. Smith., J. Mater. Chem., 2008, 18, 1792 DOI: 10.1039/B717224A

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